• The Structure of Visual Cells in the Retina of the Pond Loach, Misgurnus anguillicaudatus (Pisces; C...

• Kim Chi-Hong

• Kim Jae-Goo, Park Jong-Young

• Korean Journal of Microscopy   2015  Volume.45  No.4 254 ~ 258

• Scanning Electron Microscopic Study of Slime Formations in a Water Injection Station of Oil India Li...

• Ranjan K. Bhagobaty

• S. Purohit, M. C. Nihalani

• Korean Journal of Microscopy   2015  Volume.45  No.4 249 ~ 253

• Characterization of SiC/C Nanocomposite Powders Synthesized by Arc-Discharge

• Lei Zhou

• Jie Yi Yu, Jian Gao, Dong Xing Wang, Xiao Rong Gan

• Korean Journal of Microscopy   2015  Volume.45  No.4 242 ~ 248

• Characterization and Electrical Conductivity of Carbon-Coated Metallic (Ni, Cu, Sn) Nanocapsules

• Dong Xing Wang

• Asif Shah, Lei Zhou, Xue Feng Zhang, Chun Jing Liu, Hao Huang, Xing Long Dong

• Korean Journal of Microscopy   2015  Volume.45  No.4 236 ~ 241

• Crystallography Analysis of the ¥â-Mg17Al12 Precipitates by the Secondary Constrained Coincident Sit...

• Xuefei Huang

• Weigang Huang

• Korean Journal of Microscopy   2015  Volume.45  No.4 230 ~ 235

• Atomic Resolution Scanning Transmission Electron Microscopy of Two-Dimensional Layered Transition Me...

• Ning Lu

• Jinguo Wang, Juan Pablo Oviedo, Guoda Lian, Kim Moon-Jea

• Korean Journal of Microscopy   2015  Volume.45  No.4 225 ~ 229

• Technical Overview on the Electron Backscattered Diffraction Sample Preparation

• Kim Dong-Ik

• Kim Byung-Kyu, Kim Ju-Heon

• Korean Journal of Microscopy   2015  Volume.45  No.4 218 ~ 224

• Specimen Preparation for Scanning Electron Microscope Using a Converted Sample Stage

• Kim Hye-lan

• Kim Hyo-Sik, Yu Seung-Min, Bae Tae-Sung

• Korean Journal of Microscopy   2015  Volume.45  No.4 214 ~ 217

• Advanced Methodologies for Manipulating Nanoscale Features in Focused Ion Beam

• Kim Yang-Hee

• Seo Jong-Hyun, Lee Ji-Yeong, Ahn Jae-Pyoung

• Korean Journal of Microscopy   2015  Volume.45  No.4 208 ~ 213

• Transmission Electron Microscope Sampling Method for Three-Dimensional Structure Analysis of Two-Dim...

• Lee Sang-Gil

• Lee Ji-Hyun, Yoo Seung-Jo, Suvo Jit Datta, Hwang In-Chul, Yoon Kyung-Byung, Kim Jin-Gyu

• Korean Journal of Microscopy   2015  Volume.45  No.4 203 ~ 207

• Transmission Electron Microscopy Sample Preparation of Ge2Sb2Te5 Nanowire Using Electron Beam

• Lee Hee-Sun

• Lee Jun-Young, Yeo Jong-Souk

• Korean Journal of Microscopy   2015  Volume.45  No.4 199 ~ 202

• Preparation Method of Plan-View Transmission Electron Microscopy Specimen of the Cu Thin-Film Layer ...

• Kim Ji-Soo

• Nam Sang-Yeol, Choi Young-Hwan, Park Ju-Cheol

• Korean Journal of Microscopy   2015  Volume.45  No.4 195 ~ 198

• Cross-Sectional Transmission Electron Microscopy Specimen Preparation Technique by Backside Ar Ion M...

• Yoo Jung-Ho

• Yang Jun-Mo

• Korean Journal of Microscopy   2015  Volume.45  No.4 189 ~ 194