• Cross-Sectional Transmission Electron Microscopy Sample Preparation of Soldering Joint Using Ultrami...

• Bae Jee-Hwan

• Kwon Ye-Na, Yang Cheol-Woong

• Applied Microscopy   2016  Volume.46  No.3 167 ~ 169

• Optimal Conditions for Defect Analysis Using Electron Channeling Contrast Imaging

• Oh Jin-Su

• Yang Cheol-Woong

• Applied Microscopy   2016  Volume.46  No.3 164 ~ 166

• Effect of Dealloying Condition on the Formation of Nanoporous Structure in Melt-Spun Al60Ge30Mn10 Al...

• Kim Kang-Cheol

• Kim Won-Tae, Kim Do-Hyang

• Applied Microscopy   2016  Volume.46  No.3 160 ~ 163

• Relationship of the Distribution Thickness of Dielectric Layer on the Nano-Tip Apex and Distribution...

• Al-Qudah Ala¡¯a M.

• Mousa Marwan S.

• Applied Microscopy   2016  Volume.46  No.3 155 ~ 159

• Ultrastructure of the Fertilized Egg Envelope from Pseudobagrus fulvidraco, Bagridae, Teleostei

• Sohn Joon-Hyung

• Kwon Oh-Yun, Kim Dong-Heui

• Applied Microscopy   2016  Volume.46  No.3 150 ~ 154

• The Positive Effect of LuoHanGuo as Sugar Substitute on Blood Glucose and Metabolism in Streptozotoc...

• Lee Yoon-Jeong

• Jeong Ja-In, Kim Myoung-Ok, Nam Ju-Ock

• Applied Microscopy   2016  Volume.46  No.3 140 ~ 149

• Electrophoretic Tissue Clearing and Labeling Methods for Volume Imaging of Whole Organs

• Kim Dai-Hyun

• Ahn Hyo-Hyun, Sun Woong, Rhyu Im-Joo

• Applied Microscopy   2016  Volume.46  No.3 134 ~ 139

• A Brief Comment on Atom Probe Tomography Applications

• Seol Jae-Bok

• Kim Young-Tae, Park Chan-Gyung

• Applied Microscopy   2016  Volume.46  No.3 127 ~ 133

• A Brief Overview of Atom Probe Tomography Research

• Gault Baptiste

• Applied Microscopy   2016  Volume.46  No.3 117 ~ 126