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KMID : 1177220060090020088
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Korean Journal of Schizophrenia Research
2006 Volume.9 No. 2 p.88 ~ p.95
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Exploratory Factor Analysis of Korean Positive and Negative Syndrome Scale for Schizophrenia
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Han Hee-Jong
Kim Dae-Ho
Kim Jin-Hun
Im Hyo-Jin
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Abstract
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Objective：Positive and Negative Syndrome Scale for Schizophrenia (PANSS) is the core research instrument for measuring psychopathology of schizophrenia and many different language versions are available worldwide. Despite excellent reliability and validity of Korean PANSS was reported, to our knowledge, factorial validity was not retested. This study tested the initial factor structure of a Korean PANSS in schizophrenic inpatient population.
Methods：Principal component factor analysis was peformed from data pool of 160 schizophrenic inpatients.
Results：Exploratory analysis revealed five factor structure of the scale with total variance of 61.7%: Negative (Factor 1), Excited (Factor 2), Positive (Factor 3), Disorganized (Factor 4) and Depression/Anxiety symptoms (Factor 5).
Conclusion：Despite heterogeneity of the sample, our data support five factor model underlying schizophrenic symptomatology as assessed by the PANSS. The five-factor structure of the PANSS in Korean schizophrenic patients enables further elucidation of the various clinical aspects of schizophrenia. The Korean version of the PANSS proved the valid five factor structure and in part supported a cross-cultural factorial stability of PANSS.
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KEYWORD
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Positive and Negative syndrome Scale, Schizophrenia, Factor analysis, Psychopathology, Validity
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