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KMID : 0381919990290010075
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Korean Journal of Microscopy
1999 Volume.29 No. 1 p.75 ~ p.81
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An Investigation of Lattice Parameter Measurement of Inorganic Crystals by Electron Diffraction Patterns
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Lee Young-Bu
Kim Youn-Joong
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Abstract
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Optimum conditions for making the Au and Al internal standards for TEM have been determined experimentally. The Au internal standard was produced by sputter coating at 9mA for 100 seconds in low vacuum $(\leq1\times10^{-3})$. The Al internal standard was produced by evaporation coating at 7kV for 10 minutes in high vacuum $(\leq1\times10^{-5})$. Measurements of the lattice parameters of andalusite and albite feldspars with this Au internal standard resulted in errors of (a) $ \leq1.2%$ in precion and $\leq0.3%$ in accuracy for andalusite: (b) $\leq0.5%$ in precision and $\leq1.1%$ in accuracy for albite feldspars. The most significant error occurred from the measuring processes of distances and angles of electron diffraction patterns. By employing systematic procedures of measurement with high precision devices, this lattice parameter determination method utilizing the internal standard should be a good alternative to the conventional powder XRD method or the sophisticated CBED method for special samples.
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KEYWORD
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Internal standard, Lattice parameters, Precision, Accuracy, Measuring device
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