KMID : 0381920100400040177
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Korean Journal of Microscopy 2010 Volume.40 No. 4 p.177 ~ p.183
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Applications of Focused Ion Beam for Biomedical Research
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Kim Ki-Woo
Baek Saeng-Geul Park Byung-Joon Kim Hyun-Wook Rhyu Im-Joo
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Abstract
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A focused ion beam (FIB) system produces a beam of positive ions (usually gallium) which are heavier than electrons and can be focused by electrostatic lenses into a spot on the specimen. With its ability milling of the specimen material by 10 to 100 nm with each pass of the beam, FIB is widely adopted in materials science, semiconductor industry, and ceramics research. Recently, FIB has been increasingly employed in the field of biomedical sciences. Here we provide a brief introduction to FIB and its applications for a wide variety of biomedical research. The surface of specimen can be in situ processed and quasi-real time visualized by two beam combination of FIB and field emission scanning electron microscope (FESEM). Due to its milling process, internal structures can be exposed and analyzed: yeast cells, fungus-inoculated wheat leaf, mannitol particles in inhalation aerosols, and oyster shell. Serial blockface tomography with the system kindles 3-dimensional reconstruction researches in the realm of nervous system and life sciences. Two-beam system of FIB/FESEM is a versatile tool to be utilized in the biomedical sciences, especially in 3-dimensional reconstruction studies.
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KEYWORD
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Focused ion beam, Milling, Serial block-face, Tomography
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