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KMID : 0381920110410010075
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Korean Journal of Microscopy
2011 Volume.41 No. 1 p.75 ~ p.80
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Accuracy Improvement of Lattice Parameters Measured from Electron Diffraction Data
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Lee Sang-Gil
Song Kyung
Kim Jin-Gyu
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Abstract
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For quantitative analysis of nano-crystal structure, we reported the accuracy improvement method of lattice parameters measured from electron diffraction. For calculation of Au lattice parameters used as a standard crystal structure, it was considered two different acquisition methods (detector and enegy-filter) and three different calculation methods (conventional, least-square and regression fit). As a result, the measurement reliability could be enhanced by using CCD camera which gives higher performance, while energy-filtering did not affect the improvement the camera constant accuracy. Also, the accuracy of lattice parameters could be improved up to 10-4 order by regression fitting with correction formula. Finally, it is expected that the combination of regression fitting and intensity extraction from energy-filtered precession electron diffraction gives a solution of quantitative structure analysis for unknown nano-crystals.
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KEYWORD
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Camera constant, Electron diffraction, Lattice parameter
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