|
KMID : 1001920160590060647
|
|
Journal of Korean Neurosurgical Society
2016 Volume.59 No. 6 p.647 ~ p.649
|
|
|
Foreign Body Reaction after Implantation of a Device for Intervertebral Assisted Motion
|
|
Seo Jun-Yeong
Ha Kee-Yong
Kim Young-Hoon
Ahn Joo-Hyun
|
|
|
Abstract
|
|
|
|
The device for intervertebral assisted motion (DIAM) is a dynamic implant that consists of a silicone bumper enveloped by a polyethylene terephthalate (PET) fiber sack. Silicone and PET were used because of their biological inertness, but repetitive motion of the spine can cause wear on the implant nonetheless. The purpose of this study is to report a case of foreign body reaction (FBR) against a DIAM. A 72-year-old female patient presented with lower back pain and both legs radiating pain. She had undergone DIAM implantation at L4-5 for spinal stenosis 5 years previously. The intervertebral disc space of L4-5, where the DIAM was inserted, had collapsed and degenerative scoliosis had developed due to left-side collapse. MRI showed L3-4 thecal sac compression and left L4-5 foraminal stenosis. The patient underwent removal of the DIAM and instrumented fusion from L3 to L5. During surgery, fluid and granulation tissue were evident around the DIAM. Histopathology showed scattered wear debris from the DIAM causing chronic inflammation due to the resulting FBR. A FBR due to wear debris of a DIAM can induce a hypersensitivity reaction and bone resorption around the implant, causing it to loosen.
|
|
|
KEYWORD
|
|
|
Device for intervertebral assisted motion , Foreign body reaction , Polyethylene terephthalate , Silicone
|
|
|
FullTexts / Linksout information
|
|
|
|
|
Listed journal information
|
|
   
|